Programmable IMON accuracy in power systems

ABSTRACT

To compensate for inaccuracies in reported values for current output from a voltage regulator (VR) to a processor, the VR may be tested, and a load line determined so the processor can calculate the inaccuracy. This load line may be programmed into the BIOS as an offset, and the BIOS values used from then on so the CPU can determine what the true inaccuracy is, as opposed to the inaccuracy requested of the VR manufacturer. These values may be used during operation to control CPU turbo mode and CPU throttling.

TECHNICAL FIELD OF THE INVENTION

Various embodiments of the invention relate to control of power suppliesfor computer systems. In particular, signals from the voltage regulatorto the processor enable the processor to calculate the voltage it shouldreceive on each rail.

BACKGROUND

For the purposes of this document, IMON is the name of a signal thatrepresents the level of output current for a voltage output of a voltageregulator. Other documents may use other names to describe the samething. Typically, there is a separate IMON for each VR output voltage (5V, 12 V, etc.). Since power is equal to voltage times current, theaccuracy of the processor power calculation is directly proportional tothe accuracy of the IMON signal. This accuracy may be important. Forexample, if the processor concludes it is not consuming its powerallocation, it may go into Turbo mode and if it determines it isexceeding its power allocation, it may throttle its performance.Therefore, inaccuracies in the IMON signal may cause the processor toeither underperform or to exceed its designated performance goals.

VRs from the same manufacturing lot may have different accuracies.Therefore, an OEM may want VRs with an accuracy of +/−5%, but receiveVRs with an accuracy of (for example) only +/−20%, the differencereflecting cost savings in the VR. This variance may cause a loss ofperformance in the associated processor. For example, a more expensivehigh performance processor may only achieve the performance of a cheaperlow performance processor, simply because it mistakenly limits the powerit receives from the VR based on an inaccurate IMON reading.

BRIEF DESCRIPTION OF THE DRAWINGS

Some embodiments of the invention may be better understood by referringto the following description and accompanying drawings that are used toillustrate embodiments of the invention. In the drawings:

FIG. 1 shows s system of multiple voltage regulators (VRs) deliveringpower to multiple loads.

FIG. 2 shows a table of values representing load lines, according to anembodiment of the invention.

FIG. 3 shows a chart of two load lines, according to some embodiments ofthe invention.

FIG. 4 shows a flow diagram of a method of managing power consumption,according to an embodiment of the invention.

DETAILED DESCRIPTION

In the following description, numerous specific details are set forth.However, it is understood that embodiments of the invention may bepracticed without these specific details. In other instances, well-knowncircuits, structures and techniques have not been shown in detail inorder not to obscure an understanding of this description.

References to “one embodiment”, “an embodiment”, “example embodiment”,“various embodiments”, etc., indicate that the embodiment(s) of theinvention so described may include particular features, structures, orcharacteristics, but not every embodiment necessarily includes theparticular features, structures, or characteristics. Further, someembodiments may have some, all, or none of the features described forother embodiments.

In the following description and claims, the terms “coupled” and“connected,” along with their derivatives, may be used. It should beunderstood that these terms are not intended as synonyms for each other.Rather, in particular embodiments, “connected” is used to indicate thattwo or more elements are in direct physical or electrical contact witheach other. “Coupled” is used to indicate that two or more elementsco-operate or interact with each other, but they may or may not haveintervening physical or electrical components between them.

As used in the claims, unless otherwise specified the use of the ordinaladjectives “first”, “second”, “third”, etc., to describe a commonelement, merely indicate that different instances of like elements arebeing referred to, and are not intended to imply that the elements sodescribed must be in a given sequence, either temporally, spatially, inranking, or in any other manner.

Various embodiments of the invention may be implemented fully orpartially in software and/or firmware. This software and/or firmware maytake the form of instructions contained in or on a non-transitorycomputer-readable storage medium. The instructions may be read andexecuted by one or more processors to enable performance of theoperations described herein. The medium may be internal or external tothe device containing the processor(s), and may be internal or externalto the device performing the operations. The instructions may be in anysuitable form, such as but not limited to source code, compiled code,interpreted code, executable code, static code, dynamic code, and thelike. Such a computer-readable medium may include any tangiblenon-transitory medium for storing information in a form readable by oneor more computers, such as but not limited to read only memory (ROM);random access memory (RAM); magnetic disk storage media; optical storagemedia; a flash memory, etc.

Various embodiments of the invention may convey IMON accuracy to theprocessor with a programmable load line. For example, it is possible totranslate the accuracy of IMON to different values of the load line andprogram these values accordingly. For example, if the accuracy of IMONis well below the accuracy specified for it, then a steeper load linethan actually implemented may be programmed. Accordingly, the processor,thinking it has a steeper load line than actually implemented, mayassign a lower frequency/performance for a given power to avoidexcessive throttling.

Similarly, if IMON has a higher accuracy than specified, then ashallower load line than was actually implemented may be programmed.Accordingly, the processor, thinking it has a shallower load line thanactually implemented, may assign a higher frequency/performance for agiven power than would otherwise be used.

FIG. 1 shows s system of multiple voltage regulators (VRs) deliveringpower to multiple loads. Each VR #1-5 may output a different voltage.Each load #1-4 may represent a different module, circuit, or device thatconsumes power from one or more of the indicated VRs. The circlesindicate which loads are coupled to which VRs in this particularexample. For example, VR #1 may deliver its voltage to load #1, VR #2may delivery its voltage to load #2, VR #3 may deliver its voltage toload #3 and load #4, while VR #4 and VR #5 are not connected to any ofthe illustrated loads.

There are various ways to convey the accuracy of the current (the IMON)from a VR to the processor system using that current. Variousembodiments of the invention may convey this information through a ‘loadline’.

FIG. 2 shows a table of values representing load lines, according to anembodiment of the invention. These values are for example only, and donot necessarily represent actual values in a real system. As can be seenin the first column, each line in the table represents a differentaccuracy, with decreasing accuracy as you move down the table.Similarly, the second column may show the relative cost of each level ofaccuracy, with decreasing accuracy equating to reduced cost. The 100%figure presents the cost of the most expensive IMON. As can be seen inthe third column, the actual implemented load line is consistent throughall these examples, at 1.5 milliohms (mOhms).

However, the CPU (or other device) may program the load line to adifferent value, shown in the fourth column, by adding an offset to theactual implemented load line. As shown, the programmed value of the loadline may increase with decreasing accuracy of the IMON, resulting inbetter performance expectations for a given workload, with the amount ofimprovement going up as IMON inaccuracy goes down. In the case of FIG.2, the programmed offset for an IMON with an inaccuracy of 20% producesa performance loss of only 10%.

FIG. 3 shows a chart of two load lines, according to some embodiments ofthe invention. These are shown as examples to illustrate the concepts,but the values shown should not be taken as representative of anyreal-world implementation. The upper line with the shallower slope inFIG. 3 may be representative of an IMON with a higher accuracy. Thelower line with the steeper slope may be representative of an IMON witha lower accuracy relative to the upper line. In an actualimplementation, a single load line may be used to represent theparticular load line for a VR, but two are shown in FIG. 3 to illustratetheir relationship to each other.

Regarding the graph, the horizontal axis may be interpreted as thepercentage of maximum output current produced by the VR, ranging from 0%to 100%. On the right hand vertical axis, a % loss in frequency isindicated. In the example shown, the higher accuracy IMON load line seesa loss in frequency ranging from 0% at no output current, to anapproximate 5% loss in frequency at 100% output current. Similarly, thelower accuracy IMON load line sees a loss in frequency ranging from 0%at no output current, to an approximate 10% loss at 100% output current.

The left-hand vertical axis shows the % of gate voltage needed for 100%performance, ranging from 100% gate voltage at 0 output current, tolesser amounts of gate voltage needed for higher output currents. Thesereadings can be mapped to the % loss in frequency by simply drawing ahorizontal line across the graph and seeing where the horizontal lineintersects the load line, the % of gate voltage, and the % loss infrequency.

FIG. 4 shows a flow diagram of a method of managing power consumption,according to an embodiment of the invention. In flow diagram 400, at 410an original equipment manufacturer (OEM) or other entity may decide on adesired IMON accuracy, based on a cost/performance trade off. This tradeoff may be based, for example, on a table such as that shown in FIG. 2,or a chart such as that shown in FIG. 3. Based on this accuracy and theassociated table or chart, at 420 the OEM may program the values of aload line into a BIOS. In some embodiments, the BIOS and the associatedVR may be contained on the same die. Each wafer may produce multipledies, each with its own separate VR and BIOS, with the accuracy of theVR and IMON signal being different for each die.

After the actions of 410 and 420 the CPU may, in some embodiments, be ina non-operational state for a while, such as when it is being boxed up,shipped, and sold. But when the CPU goes into operation, it may read theprogrammed load line value at 430 and compute an expected gate voltagebased on that programmed load line. At 440 the CPU may decide on maximumturbo settings and/or PL1 frequency based on the programmed value. Forthe purposes of this document, PL1 refers to the maximum CPU power thatthe system cooling solution can maintain indefinitely withoutinterruption

EXAMPLES

The following examples pertain to particular embodiments:

Example 1 includes a device for controlling power, the device comprisinga CPU and a memory, wherein the CPU is configured to: read a programmedload line value from a BIOS; compute expected gate voltage using theload line value; and determine maximum turbo mode based on theprogrammed load line.

Example 2 includes the device of example 1, wherein the programmed loadline is to indicate IMON accuracy.

Example 3 includes the device of example 1, wherein the programmed loadline is to indicate an offset from an implemented load line.

Example 4 includes a method of power control, comprising: reading aprogrammed load line value from a BIOS; computing a gate voltage usingthe load line value; and determining maximum turbo mode based on theprogrammed load line.

Example 5 includes the method of example 4, wherein the programmed loadline indicates IMON accuracy.

Example 6 includes the method of example 4, wherein the programmed loadline indicates an offset from an implemented load line.

Example 7 includes a computer-readable non-transitory storage mediumthat contains instructions, which when executed by one or moreprocessors result in performing operations comprising: reading aprogrammed load line value from a BIOS; computing a gate voltage usingthe load line value; and determining maximum turbo mode based on theprogrammed load line.

Example 8 includes the medium of example 7, wherein the programmed loadline indicates IMON accuracy.

Example 9 includes the medium of example 7, wherein the programmed loadline indicates an offset from an implemented load line.

Example 10 includes a device for controlling power, the deviceconfigured for: selecting first and second IMON accuracies based onfirst and second cost/performance trade-offs; programming a first loadline into a first BIOS based on the selected first IMON accuracy;programming a second load line into a second BIOS based on the selectedsecond IMON accuracy;

Example 11 includes the device of example 10, wherein the first BIOS isto be contained on a first die with a first voltage regulator and thesecond BIOS is to be contained on a second die with a second voltageregulator.

Example 12 includes the device of example 11, wherein the first loadline is to indicate a first IMON accuracy and the second load line is toindicate a second IMON accuracy different than the first.

Example 13 includes the device of example 11, wherein the first loadline is to indicate an offset from an implemented load line.

Example 14 includes a method of controlling power, comprising: selectingfirst and second IMON accuracies based on first and secondcost/performance trade-offs; programming a first load line into a firstBIOS based on the selected first IMON accuracy; and programming a secondload line into a second BIOS based on the selected second IMON accuracy;

Example 15 includes the method of example 14, wherein the first loadline indicates a first IMON accuracy and the second load line indicatesa second IMON accuracy different than the first.

Example 16 includes the method of example 14, wherein the first loadline indicates an offset from an implemented load line.

Example 17 includes a computer-readable non-transitory storage mediumthat contains instructions, which when executed by one or moreprocessors result in performing operations comprising: selecting firstand second IMON accuracies based on first and second cost/performancetrade-offs; programming a first load line into a first BIOS based on theselected first IMON accuracy; and programming a second load line into asecond BIOS based on the selected second IMON accuracy;

Example 18 includes the medium of example 17, wherein the first loadline indicates a first IMON accuracy and the second load line indicatesa second IMON accuracy different than the first.

Example 19 includes the medium of example 17, wherein the first loadline indicates an offset from an implemented load line.

Example 20 includes a device for controlling power, the devicecomprising means to: read a programmed load line value from a BIOS;compute expected gate voltage using the load line value; and determinemaximum turbo mode based on the programmed load line.

Example 21 includes the device of example 20, wherein the programmedload line includes means to indicate IMON accuracy.

Example 22 includes the device of example 20, wherein the programmedload line is to includes means to indicate an offset from an implementedload line.

Example 23 includes a device for controlling power, the device includingmeans for: selecting first and second IMON accuracies based on first andsecond cost/performance trade-offs; programming a first load line into afirst BIOS based on the selected first IMON accuracy; and programming asecond load line into a second BIOS based on the selected second IMONaccuracy;

Example 24 includes the device of example 23, wherein the first BIOS isto be contained on a first die with a first voltage regulator and thesecond BIOS is to be contained on a second die with a second voltageregulator.

Example 25 includes the device of example 23, wherein the first loadline includes means to indicate a first IMON accuracy and the secondload line is to indicate a second IMON accuracy different than thefirst.

Example 26 includes the device of example 23, wherein the first loadline is to indicate an offset from an implemented load line.

The foregoing description is intended to be illustrative and notlimiting. Variations will occur to those of skill in the art. Thosevariations are intended to be included in the various embodiments of theinvention, which are limited only by the scope of the following claims.

What is claimed is:
 1. A device for controlling power, the devicecomprising: a CPU and a memory, wherein the CPU is configured to: read aprogrammed load line value from a BIOS; compute an expected gate voltageusing the load line value; and determine a maximum turbo mode based onthe programmed load line value; wherein the programmed load line valueis to indicate IMON accuracy.
 2. The device of claim 1, wherein theprogrammed load line value is to indicate an offset from an implementedload line.
 3. A method of power control, comprising: reading aprogrammed load line value from a BIOS; computing a gate voltage usingthe load line value; and determining a maximum turbo mode based on theprogrammed load line value; wherein the programmed load line valueindicates IMON accuracy.
 4. The method of claim 3, wherein theprogrammed load line value indicates an offset from an implemented loadline.
 5. A computer-readable non-transitory storage medium that containsinstructions, which when executed by one or more processors result inperforming operations comprising: reading a programmed load line valuefrom a BIOS; computing a gate voltage using the load line value; anddetermining a maximum turbo mode based on the programmed load linevalue; wherein the programmed load line value indicates IMON accuracy.6. The medium of claim 5, wherein the programmed load line valueindicates an offset from an implemented load line.
 7. A device forcontrolling power, the device configured for: selecting first and secondIMON accuracies based on first and second cost/performance trade-offs;programming a first load line value into a first BIOS based on theselected first IMON accuracy; and programming a second load line valueinto a second BIOS based on the selected second IMON accuracy.
 8. Thedevice of claim 7, wherein the first BIOS is to be contained on a firstdie with a first voltage regulator and the second BIOS is to becontained on a second die with a second voltage regulator.
 9. The deviceof claim 8, wherein the first load line value is to indicate a firstIMON accuracy and the second load line value is to indicate a secondIMON accuracy different than the first IMON accuracy.
 10. The device ofclaim 8, wherein the first load line value is to indicate an offset froman implemented load line.
 11. A method of controlling power, comprising:selecting first and second IMON accuracies based on first and secondcost/performance trade-offs; programming a first load line value into afirst BIOS based on the selected first IMON accuracy; and programming asecond load line value into a second BIOS based on the selected secondIMON accuracy.
 12. The method of claim 11, wherein the first load linevalue indicates a first IMON accuracy and the second load line valueindicates a second IMON accuracy different than the first IMON accuracy.13. The method of claim 11, wherein the first load line value indicatesan offset from an implemented load line.
 14. A computer-readablenon-transitory storage medium that contains instructions, which whenexecuted by one or more processors result in performing operationscomprising: selecting first and second IMON accuracies based on firstand second cost/performance trade-offs; programming a first load linevalue into a first BIOS based on the selected first IMON accuracy; andprogramming a second load line value into a second BIOS based on theselected second IMON accuracy.
 15. The medium of claim 14, wherein thefirst load line value indicates a first IMON accuracy and the secondload line value indicates a second IMON accuracy different than thefirst IMON accuracy.
 16. The medium of claim 14, wherein the first loadline value indicates an offset from an implemented load line.
 17. Adevice for controlling power, the device comprising a computer-readablemedium including instructions; and means to: read a programmed load linevalue from a BIOS; compute an expected gate voltage using the load linevalue; and determine a maximum turbo mode based on the programmed loadline value; wherein the programmed load line value includes means toindicate IMON accuracy.
 18. The device of claim 17, wherein theprogrammed load line value includes means to indicate an offset from animplemented load line.
 19. A device for controlling power, the deviceincluding a computer-readable medium including instructions; and meansfor: selecting first and second IMON accuracies based on first andsecond cost/performance trade-offs; programming a first load line valueinto a first BIOS based on the selected first IMON accuracy; andprogramming a second load line value into a second BIOS based on theselected second IMON accuracy.
 20. The device of claim 19, wherein thefirst BIOS is to be contained on a first die with a first voltageregulator and the second BIOS is to be contained on a second die with asecond voltage regulator.
 21. The device of claim 19, wherein the firstload line value includes means to indicate a first IMON accuracy and thesecond load line value is to indicate a second IMON accuracy differentthan the first IMON accuracy.
 22. The device of claim 19, wherein thefirst load line value is to indicate an offset from an implemented loadline.